Display panel manufacturing device

ABSTRACT

A display panel manufacturing device including a stage slider, a first stage configured to slide on the stage slider and to receive a test substrate, a second stage on the stage slider and configured to receive a main substrate, and a patterning unit located at a distance from the stage slider and configured to discharge organic drops onto the test substrate, configured to analyze patterns of the organic drops, configured to modify the patterns of the discharged organic drops according to an analysis of the patterns of the organic drops, and configured to discharge the organic drops onto the main substrate.

CROSS-REFERENCE TO RELATED PATENT APPLICATION

This application is a divisional of U.S. patent application Ser. No.13/917,533, filed on Jun. 13, 2013, which claims priority to and thebenefit of Korean Patent Application No. 10-2012-0157330, filed on Dec.28, 2012, the entire contents of both of which are incorporated hereinby reference

BACKGROUND 1. Field

Embodiments of the present invention relate to a display panelmanufacturing device.

2. Description of the Related Art

Electronic devices based on mobility have been widely used. In additionto a a small electronic device, such as a mobile phone, a tabletpersonal computer (PC) has also been widely used as a mobile electronicdevice.

Mobile electronic devices include a display apparatus to provide visualinformation, such as an image, to a user to support various functions.Other parts for driving the display apparatus have been made small, andthus a weight of the display apparatus of the mobile electronic devicehas increased. Also, display apparatuses have been developed to have abendable structure to be bent at an angle from a flat state.

The display apparatus includes a display panel, which may be formed invarious forms and by using various manufacturing methods.

Various types of processes may be used to form various types of layerson the display panel. In particular, when an organic material of thevarious types of layers of the display panel is used, the organicmaterial may be stacked, or a structure may be formed, through aprinting process. Here, in general, organic drops (e.g., droplets) aredischarged to form various types of layers or structures in a printingtechnique. In the printing technique, factors such as a resolution, etc.of the display panel are determined according to a method of formingpatterns of the organic drops. Therefore, the organic drops arepre-patterned on a test substrate, and are then patterned on a mainsubstrate. However, when the organic drops are patterned on the testsubstrate as described above, the organic drops are patterned in anadditional space not in a process of manufacturing the main substrate.

SUMMARY

Embodiments of the present invention provide a display panelmanufacturing device which precisely discharges organic drops.

According to an aspect of an embodiment of the present invention, thereis provided a display panel manufacturing device including a stageslider, a first stage configured to slide on the stage slider andconfigured to receive a test substrate, a second stage at the stageslider and configured to receive a main substrate, and a patterning unitlocated at a distance from the stage slider and configured to dischargeorganic drops onto the test substrate, configured to analyze patterns ofthe organic drops, configured to modify the patterns of the dischargedorganic drops according to an analysis of the patterns of the organicdrops, and configured to discharge the organic drops onto the mainsubstrate.

The display panel manufacturing device may further include testsubstrate raising and lowering units at the first stage that areconfigured to separate the test substrate from the first stage.

The display panel manufacturing device may further include a substrateproviding unit configured to load the test substrate onto the firststage, configured to unload the test substrate from the first stage,configured to load the main substrate onto the second stage, orconfigured to unload the main substrate from the second stage.

The display panel manufacturing device may further include a drying unitlocated at a distance from the stage slider and configured to dryorganic drops discharged onto the test substrate.

The display panel manufacturing device may further include a third stagefacing the drying unit and configured to receive the test substratethereon.

The patterning unit may include a main frame located at a distance fromthe stage slider and configured to move in a longitudinal direction ofthe stage slider and in a direction perpendicular to the longitudinaldirection, and one or more drop dischargers located at the main frameand configured to discharge the organic drops onto the test substrate orthe main substrate.

The patterning unit may further include a pattern analyzer located atthe main frame and configured to analyze patterns of the organic dropsdischarged from the drop dischargers onto the test substrate.

The patterning unit may further include a pattern analyzer located at adistance from the main frame and the stage slider and configured toanalyze patterns of the organic drops discharged onto the testsubstrate.

The display panel manufacturing device may further include a fourthstage located at a lower surface of the pattern analyzer and configuredto receive the test substrate thereon after the patterns of the organicdrops are formed on the test substrate.

The first stage may include aligned marks thereon.

The display panel manufacturing device may further include a testsubstrate heating unit inside the first stage to control a surfacetemperature of the first stage.

The first and second stages may be separated from each other or may becoupled to each other.

According to another aspect of an embodiment of the present invention,there is provided a display panel manufacturing device including a stageslider, a second stage at the stage slider and configured to receive atest substrate or a main substrate thereon, and a patterning unitlocated at a distance from the stage slider, and configured to dischargeorganic drops onto the test substrate, configured to analyze patterns ofthe organic drops to enable modification of the patterns of thedischarged organic drops, and configured to discharge the modifiedpatterns onto the main substrate.

The second stage may include a test substrate placing unit configured toplace the test substrate on the second stage.

The test substrate placing unit may include a test substrate heatingunit configured to heat the test substrate to harden the organic drops.

The display panel manufacturing device may further include testsubstrate raising and lowering units located at the second stage andconfigured to separate the test substrate from the second stage.

The display panel manufacturing device may further include a substrateproviding unit configured to move in a longitudinal direction of thestage slider and configured to load the test substrate onto the secondstage or to unload the test substrate from the second stage.

The display panel manufacturing device may further include a drying unitlocated at a distance from the stage slider and configured to dry theorganic drops discharged onto the test substrate.

The display panel manufacturing device may further include a third stagefacing the drying unit and configured to receive the test substratethereon.

The patterning unit may include a main frame located at a distance fromthe stage slider and configured to move in a longitudinal direction ofthe stage slider and in a direction perpendicular to the longitudinaldirection, and one or more drop dischargers located at the main frameand configured to discharge the organic drops onto the test substrate orthe main substrate.

The patterning unit may include a pattern analyzer located at the mainframe and configured to analyze patterns of the organic drops dischargedfrom the drop dischargers onto the test substrate.

The patterning unit may further include a pattern analyzer located at adistance from the main frame and the stage slider and configured toanalyze the patterns of the organic drops discharged onto the testsubstrate.

The display panel manufacturing device may further include a fourthstage located at a lower surface of the pattern analyzer and configuredto receive the test substrate, on which the patterns of the organic dropare formed, thereon.

The display panel manufacturing device may further include aligned markson the second stage.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other aspects of embodiments of the present invention willbecome more apparent by describing in detail exemplary embodimentsthereof with reference to the attached drawings in which:

FIG. 1 is a view illustrating a display panel manufacturing deviceaccording to an exemplary embodiment of the present invention;

FIGS. 2A through 2G are views illustrating a process of manufacturing adisplay panel through the display panel manufacturing device of theembodiment shown in FIG. 1;

FIG. 3 is a view illustrating a display panel manufacturing deviceaccording to another exemplary embodiment of the present invention;

FIG. 4 is a view illustrating a display panel manufacturing deviceaccording to another exemplary embodiment of the present invention;

FIG. 5 is a view illustrating a display panel manufacturing deviceaccording to another exemplary embodiment of the present invention;

FIG. 6 is a view illustrating a display panel manufacturing deviceaccording to another exemplary embodiment of the present invention; and

FIG. 7 is a view illustrating a display panel manufacturing deviceaccording to another exemplary embodiment of the present invention.

DETAILED DESCRIPTION

Embodiments of the present invention will now be described more fullywith reference to the accompanying drawings, in which exemplaryembodiments of the invention are shown. The described embodiments of thepresent invention may, however, be embodied in many different forms andshould not be construed as being limited to the embodiments set forthherein; rather, these embodiments are provided so that this disclosurewill be thorough and complete, and will fully convey the concept of theinvention to those skilled in the art. The terminology used herein isfor the purpose of describing particular embodiments only and is notintended to be limiting of example embodiments. As used herein, thesingular forms “a,” “an,” and “the,” are intended to include the pluralforms as well, unless the context clearly indicates otherwise. It willbe further understood that the terms “comprises,” “comprising,”“includes,” and/or “including,” when used herein, specify the presenceof stated features, integers, steps, operations, elements, and/orcomponents, but do not preclude the presence or addition of one or moreother features, integers, steps, operations, elements, components,and/or groups thereof. It will be understood that, although the terms,‘first’, ‘second’, etc. may be used herein to describe various elements,these elements should not be limited by these terms. These terms areonly used to distinguish one element from another.

FIG. 1 is a view illustrating a display panel manufacturing device 100according to an exemplary embodiment of the present invention. FIGS. 2Athrough 2G are views illustrating a process of manufacturing a displaypanel using the display panel manufacturing device 100 of the embodimentshown in FIG. 1.

Referring to FIGS. 1 and 2A through 2G, the display panel manufacturingdevice 100 includes a stage slider 110, which is installed to slide afirst stage 120 or a second stage 130 thereon, wherein the first andsecond stages 120 130 will be described later. In particular, the stageslider 110 includes a linear motion (LM) guide.

The display panel manufacturing device 100 includes the stage slider 110to allow, for example, the first stage 120 to slide on the stage slider110, the first stage 120 having a test substrate T placed thereon. Inthe present embodiment, aligned marks (e.g., alignment marks) 151 areformed on the first stage 120 to arrange the test substrate T (e.g., toensure proper alignment of the test substrate T with respect to thefirst stage 120).

The display panel manufacturing device 100 includes a second stage 130that is installed on the stage slider 110, the second stage 130 having amain substrate M placed thereon. In the present embodiment, at least oneof the first and second stages 120 and 130 is installed on the stageslider 110 to linearly move along the stage slider 110.

The display panel manufacturing device 100 includes a patterning unit140, which is installed to maintain a distance from the stage slider110, and which discharges organic drops O to the test substrate T. Thepatterning part 140 checks patterns of the organic drops O dischargedfrom the test substrate T, modifies the patterns of the organic drops O,and discharges the organic drops O having the modified patterns to themain substrate M.

In the present embodiment, the patterning unit 140 includes a main frame141 for maintaining a distance from the stage slider 110 that isinstalled to move in a longitudinal direction of the stage slider 110and in a direction perpendicular to the longitudinal direction. In thepresent embodiment, the main frame 141 may be installed on a fixed frameto be fixed to an outside to move as described above.

The patterning unit 140 includes a drop discharger 142 installed at themain frame 141 to discharge the organic drops O to the test substrate Tor the main substrate M. In the present embodiment, the patterning unit140 includes a pattern analyzer 143 installed at the main frame 141 toanalyze the patterns of the organic drops O discharged from the dropdischarger 142 to the test substrate T. In the present embodiment, thepattern analyzer 143 includes a camera or the like to capture thepatterns of the organic drops O, or includes a sensor to sense thepatterns of the organic drops O.

The display panel manufacturing device 100 includes test substrateraising and falling (e.g., raising and lowering) units 150 that areinstalled on the first stage 120 to separate the test substrate T fromthe first stage 120. In the present embodiment, a plurality of testsubstrate raising and falling units 150 may be installed on the firststage 120 at intervals, spaced from one another. The test substrateraising and falling units 150 may include cylinders which operate usingan oil pressure or an air pressure, and may elevate the test substrate Tthrough shafts, gear modules, motors, etc.

The display panel manufacturing device 100 includes a substrateproviding unit 160 that is installed to keep a distance from the stageslider 110. In the present embodiment, the substrate providing unit 160loads the test substrate T onto the first stage 120, unloads the testsubstrate T from the first stage 120, loads the main substrate M ontothe second stage 130, or unloads the main substrate M from the secondstage 130.

The substrate providing unit 160 may have various forms. For example,the substrate providing unit 160 may have the form of a robot arm, and apart of the substrate providing unit 160 may be rotated to load orunload the test substrate T or the main substrate M.

The substrate providing unit 160 is installed to move according to aposition of the first stage 120 or a position of the second stage 130,and may be installed at the fixed frame.

The substrate providing unit 160 includes a drop drying unit (e.g.,drying unit) 170 that is installed at a distance from the stage slider110, and to maintain the distance from the stage slider 110. The dropdrying unit 170 dries the organic drops O discharged to the testsubstrate T. In detail, the drop drying unit 170 is moveable to contactthe test substrate T after the organic drops O are discharged to thetest substrate T to maintain a vacuum state and to apply heat to dry theorganic drops O.

A method of operating the display panel manufacturing device 100 of theembodiment described above will now be described with reference to FIGS.2A and 2B. The test substrate T and the main substrate M arerespectively aligned on the first and second stages 120 and 130.

In the present embodiment, the test substrate T is placed on the firststage 120 by the substrate providing unit 160, which places the testsubstrate T on the first stage 120 so that the test substrate T facesthe aligned marks 151. In the present embodiment, precision is attainedaccording to an operation of the substrate providing unit 160.Therefore, the test substrate T is placed on the first stage 120 to facethe aligned marks 151.

When the test substrate T is loaded by the substrate providing unit 160,the test substrate raising and falling units 150 rise to support thetest substrate T, and then fall to place the test substrate T on thefirst stage 120.

Referring to FIG. 2C, the organic drops O are discharged from the dropdischarger 142 onto the test substrate T through the patterning unit140. In the present embodiment, examples of an organic material formingthe organic drops O may include all types of organic material that isused for manufacturing a display panel. Examples of the organic materialmay include an organic material for forming a pixel defined layer (PDL),an organic material for forming a passivation layer, and/or an organicmaterial for forming an organic emission layer.

After the organic drops O are discharged to form patterns of the organicdrops O on the test substrate T, the first stage 120 is moved to belocated below, or at a lower surface of, the drop drying unit 170 asshown in FIG. 2D. In the present embodiment, the first stage 120 slideson the stage slider 110 to be moved by one or more various types ofdriving devices. For example, a driving device may include a motor, acylinder, etc. to move the first stage 120.

When the above-described process is completed, the drop drying unit 170falls to contact the test substrate T. Also, the test substrate T may becompletely inserted into the drop drying unit 170 without contacting thedrop drying unit 170. However, for purposes of description, the dropdrying unit 170 will be described as contacting the test substrate T.

When the drop drying unit 170 contacts the test substrate T, the dropdrying unit 170 maintains contact with the test substrate T in a vacuumstate. The drop drying unit 170 applies heat to the part thereofcontacting the test substrate T to harden the patterns of the organicdrops O on the test substrate T. By applying heat, a time required fornaturally drying the patterns of the organic drops O is reduced toreduce a work time.

After the patterns of the organic drops O on the test substrate T arehardened, as described above, the drop drying unit 170 is raised andseparated from the test substrate T. Then, the first stage 120 is movedagain. In the present embodiment, the first stage 120 slides on thestage slider 110 to be at a lower surface of the patterning unit 140.

When the first stage 120 is positioned as described above, the mainframe 141 is moved in a direction perpendicular to the longitudinaldirection of the stage slider 110 to locate the pattern analyzer 143 onor above the test substrate T.

The pattern analyzer 143 analyzes the patterns of the organic drops O onthe test substrate T. In the present embodiment, the pattern analyzer143 captures the patterns of the organic drops O (e.g., captures animage of the patterns of the organic drops O) and compares the capturedpatterns/images with preset patterns of the organic drops O to analyzethe patterns of the organic drops O on the test substrate T.

The pattern analyzer 143 modifies the patterns of the organic drops Odischarged from the drop discharger 142 based on the analyzed patternsof the organic drops O. In detail, the pattern analyzer 143 compares thepatterns of the discharged organic drops O with the preset patterns ofthe organic drops O to modify a discharge speed, a discharged amount,discharged positions, etc. of the organic drops O.

When the patterns of the organic drops O on the test substrate T areanalyzed as described above, the test substrate T is separated from thefirst stage 120 through the test substrate raising and falling units150, as shown in FIG. 2G. In the present embodiment, when operations ofthe test substrate raising and falling units 150 are completed, the testsubstrate T is unloaded by the substrate providing unit 160 to bewithdrawn to an outside (e.g., to be separated from the display panelmanufacturing device 100).

When the above-described process is completed, the patterning unit 140is transferred. In detail, the main frame 141 performs a linear motion(e.g., is moved) in the longitudinal direction of the stage slider 110to position the drop discharger 142 on/over the main substrate M. In thepresent embodiment, a plurality of drop dischargers 142 may be locatedat intervals. For example, the plurality of drop dischargers 142 may befixed to the main frame 141, or may be moveably installed at the mainframe 141. The plurality of drop dischargers 142 may be variouslylocated according to the patterns of the organic drops O formanufacturing the display panel.

When a position of the patterning unit 140 is aligned as describedabove, the organic drops O are discharged onto the main substrate T bythe drop discharger 142 to manufacture the display panel. In the presentembodiment, a method of manufacturing the display panel is similar to ageneral method, and thus a detailed description thereof will be omitted.

Therefore, the display panel manufacturing device 100 separately teststhe test substrate T outside (e.g., apart from the main substrate M) anddoes not need to apply the test substrate T to the main substrate M. Asa result, logistical cost and manufacturing time are reduced. Also, thedisplay panel manufacturing device 100 tests the test substrate T inconditions similar to the manufacturing conditions of the main substrateM to enable a more accurate test. Also, the display panel manufacturingdevice 100 immediately applies a test result through a feedback, andthus the display panel is more precisely manufactured, and a failurerate is reduced.

FIG. 3 is a view illustrating a display panel manufacturing device 200according to another exemplary embodiment of the present invention.Referring to FIG. 3, the display panel manufacturing device 200 includesa stage slider 210, a first stage 220, a second stage 230, a patterningunit 240, test substrate raising and falling units (e.g., raising andlowering units) 250, a substrate providing unit 260, and a drop dryingunit (e.g., drying unit) 270. In the present embodiment, the stageslider 210, the first stage 220, the second stage 230, the testsubstrate raising and falling units 250, the substrate providing unit260, and the drop drying unit 270 are respectively similar to the stageslider 110, the first stage 120, the second stage 130, the testsubstrate raising and falling units 150, the substrate providing unit160, and the drop drying unit 170 described with reference to FIGS. 1and 2A through 2G, and their detailed descriptions will be omitted.

The patterning unit 240 includes a main frame 241, drop dischargers 242,and a pattern analyzer 243. In the present embodiment, the main frame241 and the drop dischargers 242 are similar to the main frame 141 andthe drop dischargers 142 described with reference to FIGS. 1 and 2Athrough 2G, and thus their detailed descriptions will be omitted.

The pattern unit 240 includes the pattern analyzer 243 as describedabove. In the present embodiment, the pattern analyzer 243 is installedto keep a distance from the main frame 241 and the stage slider 210. Indetail, the pattern analyzer 243 may be fixed to a fixed frame. In thepresent embodiment, the pattern analyzer 243 analyzes patterns oforganic drops O discharged to a test substrate T, as described above.

The display panel manufacturing device 200 of the present embodimentincludes a fourth stage 290 that is located on a lower surface of thepattern analyzer 243 to be placed on the test substrate T. After thepatterns of the organic drops O are formed on the first stage 220, thetest substrate T is placed on the fourth stage 290 is by the substrateproviding unit 260. The fourth stage 290 may be aligned with the firststage 220, and the substrate providing unit 260 may be located betweenthe first stage 220 and the fourth stage 290.

A method of operating the display panel manufacturing device 200 will besimilar to the above-described method of operating the display panelmanufacturing device 100 of the embodiment shown in FIGS. 1 and 2A to2G. In detail, the test substrate T is loaded on the first stage 220 bythe substrate providing unit 260. In the present embodiment, after thetest substrate raising and falling units 250 rise to receive the testsubstrate T thereon, the test substrate raising and falling units 250fall to place the test substrate T on the first stage 220.

When the above-described process is completed, the drop dischargers 242discharge the organic drops O onto the test substrate T, and the firststage 220 is moved to locate the test substrate T on a lower surface of(e.g., in or below) the drop drying unit 270. In the present embodiment,the drop drying unit 270 dries the organic drops O on the test substrateT similarly to the above-described drying method.

When the organic drops O are completely dried, the test substrate T istransferred from the first stage 220 onto the fourth stage 290. In thepresent embodiment, the test substrate T may be transferred according tovarious methods. For example, after the first stage 220, the testsubstrate T may be transferred onto the fourth stage 290 by thesubstrate providing unit 260. Also, after a position of the first stage220 is fixed, the test substrate T may be unloaded from the first stage220 by the substrate providing unit 260, and then the substrateproviding unit 260 may transfer the test substrate T onto the fourthstage 290. However, for descriptive convenience, a method oftransferring the test substrate T from the first stage 220 onto thefourth stage 290 will be hereinafter described in detail.

In detail, when the organic drops O on the test substrate T arecompletely dried, the first stage 220 is moved to an original positionthereof. In the present embodiment, the test substrate raising andfalling units 250 operate to separate the test substrate T from thefirst stage 220, and then the substrate providing unit 260 transfers thetest substrate T onto the fourth stage 290.

When the test substrate T is placed on the fourth stage 290, asdescribed above, the pattern analyzer 243 checks the patterns of theorganic drops O in a manner similar to the above-described checkingmethod, and thus a detailed description thereof will be omitted.

After the patterns of the organic drops O are analyzed, as describedabove, the drop dischargers 242 are controlled based on the analysisresult to adjust the organic drops O discharged from the dropdischargers 242. In the present embodiment, a method and a factor foradjusting the organic drops O are similar to those described above, andthus their detailed descriptions will be omitted. In the presentembodiment, the main frame 241 is positioned on or above the mainsubstrate M, and the drop dischargers 242 discharge the organic drops Oonto the main substrate M.

Accordingly, the display panel manufacturing device 200 separately teststhe test substrate T outside (e.g., the test substrate T is testedseparately and by itself) and does not need to apply the test substrateT to the main substrate M. Therefore, logistical cost and manufacturingtime are reduced. Also, the display panel manufacturing device 200 teststhe test substrate T in conditions similar to the manufacturingconditions of the main substrate M to enable a more accurate test. Thedisplay panel manufacturing device 200 quickly applies the test througha feedback, and thus a display panel is more precisely manufactured, anda failure rate is reduced.

FIG. 4 is a view illustrating a display panel manufacturing device 300according to another exemplary embodiment of the present invention.Referring to FIG. 4, the display panel manufacturing device 300 includesa stage slider 310, a first stage 320, a second stage 330, a fourthstage 390, a patterning unit 340, test substrate raising and fallingunits 350, a substrate providing unit 360, and a drop drying unit (e.g.,drying unit) 370. The stage slider 310, the first stage 320, the secondstage 330, the fourth stage 390, the test substrate raising and fallingunits (e.g., the test substrate raising and lowering units) 350, thesubstrate providing unit 360, and the drop drying unit 370 arerespectively similar to the stage slider 210, the first stage 220, thesecond stage 230, the fourth stage 290, the test substrate raising andfalling units 250, the substrate providing unit 260, and the drop dryingunit 270, and thus their detailed descriptions will be omitted.

The patterning unit 340 includes a main frame 341, drop dischargers 342,and a pattern analyzer 343. In the present embodiment, the main frame341, the drop dischargers 342, and the pattern analyzer 343 are similarto the first main frame 241, the drop dischargers 242, and the patternanalyzer 243 described with reference to FIG. 3, and thus their detaileddescriptions will be omitted.

The display panel manufacturing device 300 of the present embodimentincludes a third stage 380 that is located to face the drop drying unit370 and to place a test substrate T thereon. In the present embodiment,when the drop drying unit 370 dries the test substrate T, the testsubstrate T is placed on the third stage 380 to be supported by thethird stage 380. When the third stage 380 is installed as describedabove, the drop drying unit 370 is not located on the stage slider 310,but is located to face the third stage 380. When the third stage 380 andthe drop drying unit 370 are oriented in the manner shown, the thirdstage 380 and the drop drying unit 370 may be installed in a spaceseparately from the stage slider 310, the first stage 320, the secondstage 330, etc.

A method of operating the display panel manufacturing device 300 may beperformed as described in the previous exemplary embodiments. In detail,the test substrate T is loaded on the first stage 320 by the substrateproviding unit 360. In the present embodiment, when, after the testsubstrate raising and falling units 350 rise and the test substrate T isplaced thereon, the test substrate raising and falling units 350fall/lower to place the test substrate T on the first stage 320.

When the above-described process is completed, the drop dischargers 342discharge organic drops O onto the test substrate T. When the organicdrops O are completely discharged onto the test substrate T on the firststage 320, the test substrate raising and falling units 350 raise thetest substrate T. In the present embodiment, the substrate providingunit 360 loads the test substrate T from the test substrate raising andfalling units 350 to move the test substrate T from the first stage 320to the third stage 380.

When the test substrate T is moved to the third stage 380, the dropdrying unit 370 falls (e.g., lowers to be proximate the test substrateT) to dry the test substrate T. In the present embodiment, a method ofdrying the test substrate T through the drop drying unit 370 is similarto that described above, and thus a detailed description thereof will beomitted.

When the organic drops O are completely dried, the test substrate T istransferred from the third stage 380 to the fourth stage 390. In thepresent embodiment, the test substrate T may be transferred according tovarious methods. For example, after the third stage 380 is transferred,the test substrate T may be transferred to the fourth stage 390 by thesubstrate providing unit 360. Also, after a position of the third stage380 is fixed, the test substrate T may be unloaded by the substrateproviding unit 360, and then transferred to the fourth stage 390.However, for descriptive convenience, a method of transferring the testsubstrate T from the third stage 380 to the fourth stage 390 by thesubstrate providing unit 360 will be described in detail.

In detail, when the organic drops O on the test substrate T arecompletely dried, the test substrate T is transferred from the thirdstage 380 to the fourth stage 390 by the substrate providing unit 360.In the present embodiment, the test substrate T may be raised from andlowered onto the third and fourth stages 380 and 390 using structuressimilar to the test substrate raising and falling units 350.

When the test substrate T is placed on the fourth stage 390, the patternanalyzer 343 checks patterns of the organic drops O. In the presentembodiment, a method of checking the patterns of the organic drops Othrough the pattern analyzer 343 is performed as described above, andthus a detailed description thereof will be omitted.

After the pattern analyzer 343 analyzes the patterns of the organicdrops O, as described, the drop dischargers 342 are controlled, based onthe analysis result, to adjust the organic drops O discharged from thedrop dischargers 342. In the present embodiment, a method and a factorfor adjusting the organic drops O are similar to those described above,and thus detailed descriptions thereof will be omitted. Then, the mainframe 341 may be positioned on the main substrate M, and the dropdischargers 342 may discharge modified patterns of the organic drops Oonto the main substrate M.

Therefore, the display panel manufacturing device 300 separately teststhe test substrate T, and does not need to apply the test substrate T tothe main substrate M. As a result, logistical cost and manufacturingtime are reduced. Also, the display panel manufacturing device 300 teststhe test substrate T in conditions similar to the manufacturingconditions of the main substrate M to enable a more accurate test. Inaddition, the display panel manufacturing device 300 immediately appliesthe test result through a feedback, and thus a display panel is moreprecisely manufactured, and a failure rate is reduced.

The display panel manufacturing device 300 additionally forms the dropdrying unit 370 for drying the test substrate T to avoid factors thatmay affect a process of the main substrate M due to drying of the testsubstrate T.

FIG. 5 is a view illustrating a display panel manufacturing device 400according to another exemplary embodiment of the present invention.Referring to FIG. 5, the display panel manufacturing device 400 includesa stage slider 410, a first stage 420, a second stage 430, a patterningunit 440, test substrate raising and falling/lowering units 450, and asubstrate providing unit 460. In the present embodiment, the stageslider 420, the first stage 420, the test substrate raising and fallingunits 450, and the substrate providing unit 460 are respectively similarto the stage slider 110, the first stage 120, the test substrate raisingand falling units 150, and the substrate providing unit 160 describedwith reference to FIGS. 1 and 2A through 2G, and thus their detaileddescriptions will be omitted.

In the present embodiment, the first and second stages 420 and 430 areinstalled to be adjacent each other. In detail, the first and secondstages 420 and 430 may be, for example, coupled to each other orintegrated into a single body.

The patterning unit 440 includes a main frame 441, drop dischargers 442,and a pattern analyzer 443. In the present embodiment, the patterningunit 440 may include the main frame 141, the drop dischargers 142,and/or the pattern analyzer 143 described with reference to theembodiment shown in FIGS. 1 and 2A through 2G. Alternatively, thepattern analyzer 440 may include the main frame 241/341, the dropdischargers 242/342, and/or the pattern analyzer 243/343 described withreference to the embodiments shown in FIGS. 3 and 4. However, fordescriptive convenience, the patterning unit 440 will be described asincluding the main frame 141, the drop dischargers 142, and the patternanalyzer 143 described with reference to the embodiment shown in FIGS. 1and 2A through 2G. The main frame 441, the drop dischargers 442, and thepattern analyzer 443 are the same as the main frame 131, the dropdischargers 142, and the pattern analyzer 143 described with referenceto the embodiment shown in FIGS. 1 and 2A through 2G, and thus theirdetailed descriptions will be omitted.

The display panel manufacturing device 400 includes a test substrateheating unit 421, which may be installed at/on/in the first stage 420 tocontrol a surface temperature of the first stage 420. For example, thetest substrate heating unit 421 may include a heating device such asheat rays, a heater, or the like installed in the first stage 420. Inthe present embodiment, as described with reference to FIGS. 1 and 2Athrough 2G, the display panel manufacturing device 400 need not includea drop drying unit (e.g., drying unit) 470.

The display panel manufacturing device 400 may also include a thirdstage and a fourth stage. In the present embodiment, the third andfourth stages may be formed equally or similarly to the third and fourthstages 380 and 390 described with reference to FIGS. 3 and 4. However,for descriptive convenience, the first and second stages 420 and 430will be described as being installed without the third and fourthstages.

A method of operating the display panel manufacturing device 400 may besimilar to the methods described in the previous exemplary embodiments.In detail, a test substrate T is loaded on the first stage 420 by thetest substrate providing unit 460. In the present embodiment, after thetest substrate raising and falling units 450 rise, and when the testsubstrate T is placed thereon, the test substrate raising and fallingunits 450 lower to place the test substrate T on the first stage 420.

When the above-described process is completed, organic drops O aredischarged onto the test substrate T through the drop dischargers 442.When the organic drops O are completely discharged onto the testsubstrate T, which is placed on the first stage 420, the test substrateT on the first stage 420 is heated by the test substrate heating unit421. The organic drops O on the test substrate T are then dried andhardened by heating as described above.

The organic drops O on the test substrate T are dried as describedabove, and then patterns of the organic drops O are analyzed through thepattern analyzer 443. In the present embodiment, the method of analyzingthe patterns of the organic drops O through the pattern analyzer 443 issimilar to the above-described method, and thus a detailed descriptionthereof will be omitted.

When the above-described process is completed, the main frame 441performs a linear motion (e.g., moves linearly) in a longitudinaldirection of the stage slider 410 to locate the drop dischargers 442on/above the main substrate M.

In the present embodiment, after the pattern analyzer 443 analyzes thepatterns of the organic drops O as described above, the drop dischargers442 are controlled based on the analysis result to adjust the organicdrops O discharged from the drop dischargers 442. A method and a factorfor adjusting the organic drops O are similar to the method and thefactor described in the previous exemplary embodiment, and thus adetailed description thereof will be omitted. In the present embodiment,the main frame 441 may be positioned on or over the main substrate M,and the drop dischargers 442 may discharge modified patterns of theorganic drops O onto the main substrate M.

Accordingly, the display panel manufacturing device 400 separately teststhe test substrate T, and then does not need to apply the test substrateT to the main substrate M. Therefore, logistical cost and manufacturingtime are reduced. Also, the display panel manufacturing device 400 teststhe test substrate T in conditions similar to the manufacturingconditions of the main substrate M to enable an accurate test. Inaddition, the display panel manufacturing device 400 immediately appliesthe test result through a feedback, and thus a display panel isprecisely manufactured, and a failure rate is reduced.

FIG. 6 is a view illustrating a display panel manufacturing device 500according to another exemplary embodiment of the present invention.Referring to FIG. 6, the display panel manufacturing device 500 includesa stage slider 510, a second stage 530, a patterning unit 540, testsubstrate raising and falling units, a drop drying unit (e.g., dryingunit) 570, and a substrate providing unit 560. In the presentembodiment, the stage slider 510, the second stage 530, the testsubstrate raising and falling units, the drop drying unit 570, and thesubstrate providing unit 560 are respectively similar to the stageslider 110, the second stage 130, the test substrate raising and fallingunits 150, the drop drying unit 170, and the substrate providing unit160 of the embodiment shown in FIGS. 1 and 2A through 2G, and thus theirdetailed descriptions will be omitted.

The patterning unit 540 of the present embodiment includes a main frame541, drop dischargers 542, and a pattern analyzer 543. In the presentembodiment, the patterning unit 540 may include the main frame 141, thedrop dischargers 142, and the pattern analyzer 143 of the embodiment ofFIGS. 1 and 2A through 2G, or may include the main frame 241/341, thedrop dischargers 242/342, and/or the pattern analyzer 243/343 of theembodiments of FIGS. 3 and 4. However, for descriptive convenience, thepatterning unit 540 will be hereinafter described as including the mainframe 141, the drop dischargers 142, and the pattern analyzer 143described with reference to FIGS. 1 and 2A through 2G. Also, the mainframe 541, the drop dischargers 542, and the pattern analyzer 543 arerespectively the same as the main frame 141, the drop dischargers 142,and the pattern analyzer 143 described with reference to FIGS. 1 and 2Athrough 2G.

The display panel manufacturing device 500 may include a third stage anda fourth stage. In the present embodiment, the third and fourth stagesmay be formed equally or similarly to the third and fourth stages 380and 390 described with reference to FIGS. 3 and 4. However, fordescriptive convenience, only the second stage 530 will be hereinafterdescribed as being installed without the third and fourth stages.

Aligned marks (e.g., alignment marks) may be formed on the second stage530 to align a test substrate T. In the present embodiment, the alignedmarks may be formed and operate equally or similarly to the alignedmarks 151 formed on the first stage 120 as described with reference toFIGS. 1 and 2A through 2G.

A method of operating the display panel manufacturing device 500 may besimilar to the above-described method. In detail, the test substrate Tis loaded on the second stage 530 by the substrate providing unit 560.In the present embodiment, after the test substrate raising and fallingunits raise, when the test substrate T is placed thereon, the testsubstrate raising and falling units lower to place the test substrate Ton the second stage 530.

When the above-described process is completed, organic drops O aredischarged onto the test substrate T through drop dischargers 542. Whenthe organic drops O are completely discharged onto the test substrate Tplaced on the second stage 530, the second stage 530 performs a linearmotion (e.g., moves) in a longitudinal direction of the stage slider 510to place the test substrate T on a lower surface of the drop drying unit570. In the present embodiment, the drop drying unit 570 falls to dryand harden the organic drops O on the test substrate T as described withreference to FIGS. 1 and 2A through 2G.

After the organic drops O are dried on the test substrate T as describedabove, patterns of the organic drops O are analyzed through a patternanalyzer 543. A method of analyzing the patterns of the organic drops Othrough the pattern analyzer 543 is similar to the above-describedmethod, and thus a detailed description thereof will be omitted.

When the above-described process is completed, the substrate providingunit 560 unloads the test substrate T from the second stage 530, andthen loads the main substrate M onto the second stage 530. Then, themain frame 541 moves in the longitudinal direction of the stage slider510 to locate the drop dischargers 542 on or above the main substrate M.

In the present embodiment, after the organic drops O are analyzed asdescribed above, the drop dischargers 542 are controlled based on theanalysis result to adjust the organic drops O discharged from the dropdischargers 542. A method and a factor for adjusting the organic drops Ois similar to the above-described method and factor, and thus detaileddescriptions will be omitted. In the present embodiment, the main frame541 is positioned on the main substrate M, and the drop dischargers 542discharges modified patterns of the organic drops O onto the mainsubstrate M.

Accordingly, the display panel manufacturing device 400 separately teststhe test substrate T, and does not need to apply the test substrate T tothe main substrate M. Therefore, logistical cost and manufacturing timeare reduced. The display panel manufacturing device 500 tests the testsubstrate T in conditions similar to the manufacturing conditions of themain substrate M to enable an accurate test. Also, the display panelmanufacturing device 500 immediately applies the test result through afeedback, and thus a display panel is precisely manufactured, and afailure rate is reduced.

FIG. 7 is a view illustrating a display panel manufacturing device 600according to another exemplary embodiment of the present invention.Referring to FIG. 7, the display panel manufacturing device 600 includesa stage slider 610, a second stage 630, a patterning unit 640, testsubstrate raising and falling units, and a substrate providing unit 660.In the present embodiment, the stage slider 610, the second stage 630,the test substrate raising and falling units, and the substrateproviding unit 660 are respectively similar to the stage slider 510, thesecond stage 530, the test substrate raising and falling units, and thesubstrate providing unit 560 described with reference to FIG. 6, andthus their detailed descriptions will be omitted.

The patterning unit 640 includes a main frame 641, drop dischargers 642,and the pattern analyzer 643. In the present embodiment, the patterningunit 640 may include the main frame 141/241/341, the drop dischargers142/242/342, and/or the pattern analyzer 143/243/343 of the embodimentsdescribed with reference to FIGS. 1 through 4. However, for descriptiveconvenience, the patterning unit 640 will be hereinafter described asincluding the main frame 141, the drop dischargers 142, and the patternanalyzer 143 of the embodiment shown in FIGS. 1 and 2A through 2G. Also,the main frame 641, the drop dischargers 642, and the pattern analyzer643 are the same as the main frame 141, the drop dischargers 142, andthe pattern analyzer 143 described with reference to FIGS. 1 and 2Athrough 2G, and thus their detailed descriptions will be omitted.

The display panel manufacturing device 600 may include a third stage anda fourth stage. In the present embodiment, the third and fourth stagesare the same as the third and fourth stages 380 and 390 described withreference to FIGS. 3 and 4. However, for descriptive convenience, onlythe second stage 630 will be hereinafter described as being installedwithout the third and fourth stages.

The second stage 630 includes a test substrate placing unit 631 thatplaces the test substrate T on the second stage 630. In the presentembodiment, the test substrate placing unit 631 includes a testsubstrate heating unit 632 that heats a test substrate T to hardenorganic drops O. In particular, the test substrate heating unit 632 maybe formed in a plate form, and may include a heating device such as heatrays, a heater, or the like.

A method of operating the display panel manufacturing device 600 may besimilar to the above-described method. In detail, the test substrate Tis loaded onto the second stage 630 by the substrate providing unit 660.In the present embodiment, the test substrate T is placed on the testsubstrate placing unit 631 on the second stage 630. In particular, thetest substrate raising and falling units are installed at the testsubstrate placing unit 631, and then rise. Also, after the testsubstrate T is placed on the test substrate raising and falling units,the test substrate raising and falling units fall to place the testsubstrate T on the second stage 630.

When the above-described process is completed, the organic drops O aredischarged onto the test substrate T through the drop dischargers 642.When the organic drops O are completely discharged onto the testsubstrate T on the second state 630, the test substrate heating unit 632operates to dry and harden the organic drops O on the test substrate T.

After the organic drops O on the test substrate T are dried, asdescribed above, patterns of the organic drops O are analyzed throughthe pattern analyzer 643. In the present embodiment, a method ofanalyzing the patterns of the organic drops O through the patternanalyzer 643 is similar to the above-described method, and thus adetailed description thereof will be omitted.

When the above-described process is completed, the substrate providingunit 660 unloads the test substrate T from the second stage 630, andloads the main substrate M onto the second stage 630. In the presentembodiment, the test substrate raising and falling units operate toseparate the test substrate T from the test substrate placing unit 631.

When the above-described process is completed, the main frame 641performs a linear motion (e.g., moves) in a longitudinal direction ofthe stage slider 610 to locate the drop dischargers 642 on the mainsubstrate M.

In the present embodiment, after the patterns of the organic drops O areanalyzed as described above, the drop dischargers 642 are controlledbased on the results of the analysis to adjust the organic drops Odischarged from the drop dischargers 642. A method and a factor foradjusting the organic drops O are similar to the above-described methodand factor, and thus their detailed descriptions will be omitted. In thepresent embodiment, the main frame 641 is positioned on the mainsubstrate M, and the drop dischargers 642 discharges modified patternsof the organic drops O onto the main substrate M.

Accordingly, the display panel manufacturing device 600 separately teststhe test substrate T, and does not need to apply the test substrate T tothe main substrate M. Therefore, logistical cost and manufacturing timeare reduced. The display panel manufacturing device 600 also tests thetest substrate T in the same conditions as manufacturing conditions ofthe main substrate M to enable an accurate test. The display panelmanufacturing device 600 also immediately applies the test resultthrough a feedback, and thus a display panel is precisely manufactured,and a failure rate is reduced.

According to exemplary embodiments of the present invention as describedabove, after a test substrate is tested, a main substrate does not needto be applied. Therefore, logistical cost and manufacturing time arereduced. Also, the test substrate is tested in conditions that aresimilar to the manufacturing conditions of the main substrate to enablean accurate test. In addition, the test result is immediately appliedthrough a feedback, and thus a display panel is precisely manufactured,and a failure rate is reduced.

While embodiments of the present invention have been particularly shownand described with reference to exemplary embodiments thereof, it willbe understood by those of ordinary skill in the art that various changesin form and details may be made therein without departing from thespirit and scope of the present invention as defined by the followingclaims, and their equivalents.

What is claimed is:
 1. A display panel manufacturing device comprising:a stage slider; a second stage at the stage slider and configured toreceive a test substrate or a main substrate thereon; a patterning unitlocated at a distance from the stage slider, and configured to dischargeorganic drops onto the test substrate, configured to analyze patterns ofthe organic drops to enable modification of the patterns of the organicdrops, and configured to discharge modified patterns onto the mainsubstrate; and test substrate raising and lowering units located at, andcoupled to, the second stage and configured to separate the testsubstrate from the second stage by adjusting a vertical position of thetest substrate with respect to the second stage, wherein the secondstage comprises a test substrate placing unit configured to place thetest substrate on the second stage, the test substrate raising andlowering units being installed at the test substrate placing unit andconfigured to place the test substrate on, and to separate the testsubstrate from, the test substrate placing unit, wherein the testsubstrate placing unit comprises a test substrate heating unitconfigured to heat the test substrate to harden the organic drops,wherein the test substrate placing unit is on the second stage andsmaller than the second stage, and wherein the test substrate is smallerthan the main substrate.
 2. The display panel manufacturing device ofclaim 1, further comprising a substrate providing unit configured tomove in a longitudinal direction of the stage slider and configured toload the test substrate onto the second stage or to unload the testsubstrate from the second stage.
 3. The display panel manufacturingdevice of claim 1, wherein the patterning unit comprises: a main framelocated at a distance from the stage slider and configured to move in alongitudinal direction of the stage slider and in a directionperpendicular to the longitudinal direction; and one or more dropdischargers located at the main frame and configured to discharge theorganic drops onto the test substrate or the main substrate.
 4. Thedisplay panel manufacturing device of claim 3, wherein the patterningunit comprises a pattern analyzer located at the main frame andconfigured to analyze patterns of the organic drops discharged from thedrop dischargers onto the test substrate.
 5. The display panelmanufacturing device of claim 3, wherein the patterning unit furthercomprises a pattern analyzer located at a distance from the main frameand the stage slider and configured to analyze the patterns of theorganic drops discharged onto the test substrate.
 6. The display panelmanufacturing device of claim 5, further comprising a fourth stagelocated at a lower surface of the pattern analyzer and configured toreceive the test substrate, on which the patterns of the organic dropsare formed, thereon.
 7. The display panel manufacturing device of claim1, further comprising aligned marks at the second stage.
 8. A displaypanel manufacturing device comprising: a stage slider; a second stage atthe stage slider and configured to receive a test substrate or a mainsubstrate thereon; a patterning unit located at a distance from thestage slider, and configured to discharge organic drops onto the testsubstrate, configured to analyze patterns of the organic drops to enablemodification of the patterns of the organic drops, and configured todischarge modified patterns onto the main substrate; test substrateraising and lowering units located at, and coupled to, the second stageand configured to separate the test substrate from the second stage byadjusting a vertical position of the test substrate with respect to thesecond stage; and a drying unit located at a distance from the stageslider and configured to dry the organic drops discharged onto the testsubstrate by dropping onto the test substrate when the second stagemoves along the stage slider to be positioned under the drying unit, andby contacting the test substrate, wherein the test substrate is smallerthan the main substrate, wherein the drying unit dries the organic dropson the test substrate in a vacuum state by heating, and wherein aposition of the second stage for discharging organic drops onto the testsubstrate is different from a position of the second stage for dryingthe organic drops.
 9. The display panel manufacturing device of claim 8,further comprising a third stage facing the drying unit and configuredto receive the test substrate thereon.